1997P – 1DER; 011 – 020 Files

1997P-1DER-011WS                                  180°

DESCRIPTION: Moderate step deviation is seen under columns 6, 7, 8 and 9.

DIE MARKERS: Stage “B”, obverse is MDS – small die scratch over the E of WE. Small die gouge is seen under the T of TRUST. Die chip on the bridge of nose.

Reverse is MDS – die chip on the upper part of column 2.

 

1997P-1DER-012WS                                 200°

DESCRIPTION: Strong fluting line extension, into the stylobate under columns 2 and 3. Strong to moderate step deviation is seen under columns 5 through 8 with an offset direction of 190 degrees.

DIE MARKERS: Stage “A”, obverse is EDS – die gouge to the lower left of IN

Reverse is EDS – die gouge to the left of the A in AMERICA. Die crack across the U of UNUM.

 

1997P-1DER-013WS                                 180°

DESCRIPTION: Moderate to light step deviation is seen under columns 5 through 8.

DIE MARKERS: Stage “C”, obverse is LDS – small die dot on the right side of the second 9 in the date.

Reverse is LDS – small die gouge on the right side of the N in ONE.

 

1997P-1DER-014WS                                 180°

DESCRIPTION: Light fluting line extension, into the stylobate, under columns 2 and 3. Light step deviation is seen under columns 5 through 8.

DIE MARKERS: Stage “B”, obverse is MDS – none observed

Reverse is MDS – three small die gouges to the left of the base. Die gouge on the left of the T in CENT.

 

1997P-1DER-015WS                                  180°

DESCRIPTION: A light fluting line extension is seen into the stylobate, under column 3. Light step deviation is seen under columns 5, 6 and 7.

                                        Stage “B”                                                                         Stage “C”

DIE MARKERS: Stage “B”, obverse is MDS- none observed

Reverse is MDS – die chip in column 2.

Stage “C”, obverse is MDS – none observed

Reverse is LDS – die chip on the left edge of the Memorial roof. Two die chips are seen in column 2 and a chip in column 12.

 

1997P-1DER-016WS                                  180°

DESCRIPTION: Light step deviation is seen under columns 5, 6 and 7.

DIE MARKERS: Stage “C”, obverse is LDS – light vertical die scratching around the throat area of Lincoln.

Reverse is LDS – die gouge between the N and T of CENT.

 

1997P-1DER-017WS                                  180°

DESCRIPTION: Light step deviation is seen under columns 5, 6 and 7.

DIE MARKERS: Stage “C”, obverse is LDS – none noted

Reverse is LDS – die chip on the left cornice edge. Die gouge between the C and A of AMERICA.

 

1997P-1DER-018WS                                 180°

DESCRIPTION: Moderate step deviation is seen under columns 5 through 8.

DIE MARKERS: Stage “B”, obverse is MDS – none observed

Reverse is MDS – die gouge in bay 1. Die dot under the left base of the Memorial building.

 

1997P-1DER-019WS                                  180°

DESCRIPTION: Light step deviation is seen under columns 5 through 8.

DIE MARKERS: Stage “B”, obverse is MDS – none observed

Reverse is MDS – extra column on right side of LINCOLN’S statue. Small die dot in bay 11.

 

1997P-1DER-020T                                    000°

DESCRIPTION: Light distortion on the tops of some of the letters in EPU, with an offset direction of 000 degrees. This is not a very pretty coin and has a bunch of environmental damage; however, it is clear enough to show the faint trail lines.

DIE MARKERS: Stage “C”, obverse is LDS – a series of small die gouges under and to the left side of IN.

Reverse is LDS – a die gouge is seen to the right of the vertical of the T in CENT.

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