1994P – 1DER; 031 – 040 Files

1994P-1DER-031WS                                  180°

DESCRIPTION: Light step deviation is seen under columns 5 through 7 with emphasis on the left side.

DIE MARKERS: Stage “C”, obverse is LDS – die gouges above the 9s in the DATE.

Reverse is LDS – long die scratch from the M to the R of AMERICA. Die chip on the lower part of column # 10.

1994P-1DER-032WS                                 180°

DESCRIPTION: Moderate step deviation is seen under columns 5 through 7.

DIE MARKERS: Stage “B”, obverse is MDS – none noted

Reverse is MDS – die scrapes through the NE of ONE and the T of cent.

 

1994P-1DER-033WS                                 180°

DESCRIPTION: Moderate step deviation is seen under columns 5, 6 and 7.

DIE MARKERS: Stage “B”, obverse is MDS – small die gouge over the first T in TRUST.

Reverse is MDS – a group of small die gouges to the right of the last A in AMERICA.

 

1994P-1DER-034WS                                200°

DESCRIPTION: Moderate fluting line extension into the stylobate under columns 2 and 3. Also seen is a corner extension into the third level stylobate. Light step deviation is seen under columns 5, 6 and 7, with an offset direction of 200 degrees.

DIE MARKERS: Stage “C”, obverse is LDS – none noted.

Reverse is LDS – small die chip on the edge of the left cornice. Die crack the entire length of column 1.

 

1994P-1DER-035WS                                200°

DESCRIPTION: Moderate fluting line extension into the stylobate under columns 2 and 3. Moderate step deviation is seen under columns 5 through 8 with an offset direction of 200 degrees.

DIE MARKERS: Stage “C”, obverse is LDS – none noted

Reverse is LDS – die scrape of the bottom of the E in UNITED. A group of small die gouges below the right base line.

 

1994P-1DER-036WS                                200°

DESCRIPTION: Moderate fluting line extension, into the stylobate, under columns 2 and 3. Moderate step deviation is seen under columns 5 through 8 with an offset direction of 200 degrees.

DIE MARKERS: Stage “C”, obverse is LDS – diagonal die scratches through LIBERTY. Die gouge under the base of Lincoln’s bust next to the rim.

Reverse is LDS – small die gouges under the second shrub on the right base.

1994P-1DER-037WS                                 180°

DESCRIPTION: Light step deviation is seen under columns 6, 7 and 8, with predominance on the left side.

DIE MAKERS: Stage “C”, obverse is LDS – none noted

Reverse is MLS – none noted

 

1994P-1DER-038WS                                180°

DESCRIPTION: Very light step deviation is seen under columns 5, 6 and 7.

DIE MARKERS: Stage “C”, obverse is LDS – none observed

Reverse is LDS – faded die clash in bay 4.  Die crack from the rim to the right base of the Lincoln Memorial.

 

1994P-1DER-039WST                               140°

DESCRIPTION: Trails from STATES, EPU and very faintly on the E of CENT. There is also a fluting line extension, into the stylobate, under column 10. The offset direction is 140 degrees. This die was found by Bob Piazza of Florida

DIE MARKERS: Stage “B”, obverse is MDS – small die gouge to the left of the R in TRUST.

Reverse is MDS – light die scratching in the lower part of bay 1 and 2.

 

1994P-1DER-040T                                   330°


DESCRIPTION: Trails on TED of UNITED, TTS of STATES, O in OF, the letters in EPU, the cornice top, the left top of all the columns and the E of CENT. Notice the peculiar notch in the last A of AMERICA and the letter distortion on the tops of EPU. This also has a split left column 8. The offset direction is 330 degrees. This die is similar to 1994P-1DER-023T

                                                                 STAGE “B”

                                       STAGE “B”                                   STAGE “C”

                                    STAGE “B”                                      STAGE “C”

                               STAGE “B”                                      STAGE “C”

DIE MARKERS: Stage “B”, obverse is MDS – die gouge from WE to TRUST. Die crack on the bottom left of the second 9 in the date.

Reverse is MDS – die scratching in all the bays. Die chip on the top of Column 1. Die scratch under the right base

Stage “C”, obverse is EDS – die has been changed.

Reverse is LDS – die scratching in the bays  has faded. Die chip in column 1 has increased.

NOTE: Stage “C” was found by Louis Schaeffer.

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